Layout Elements - Oxford Instruments

Asylum Gallery Image

EFM phase on topography overlay of a carbon nanotube

Author: Asylum Research

Published: 16 Nov 2017 · Last updated: 12 Jul 2018

Tags: gallery_category: Other Materials

Electric force microscopy (EFM) (top) and a current-voltage curve (bottom) of a carbon nanotube attached to an electrode. Since the carbon nanotube is conducting, and has continuity to ground here, the EFM phase image shows excellent contrast. In the image, color represents the EFM phase channel, and the surface rendered with ARgyle represents topography. Scan size 5 µm x 2.5 µm. Imaged with the MFP-3D AFM. Courtesy Minot Lab, Oregon State University.

Downloads

  • SWNT-EFMOI.jpg

← Back to Learning