Bit-mapped voltage lithography on a sol-gel PZT thin film. The piezo force microscopy phase is overlaid on top of amplitude. Scan size 20 µm. Imaged with the MFP-3D AFM.
Image Courtesy of B. Gibbons, Oregon State University.
Date: 16th November 17
Last Updated: July 12, 2018, 11:13 am
Author: Asylum Research
Category: Asylum Gallery Image
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