Part of the Oxford Instruments Group

Lithography on sol-gel PZT thin film

Bit-mapped voltage lithography on a sol-gel PZT thin film. The piezo force microscopy phase is overlaid on top of amplitude. Scan size 20 µm. Imaged with the MFP-3D AFM. Image Courtesy of B. Gibbons, Oregon State University.

Date: 16th November 17

Last Updated: July 12, 2018, 11:13 am

Author: Asylum Research

Category: Asylum Gallery Image