Layout Elements - Oxford Instruments

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PFM

Author: Asylum Research

Published: 16 Nov 2017 · Last updated: 12 Jul 2018

Bit-mapped voltage lithography on a sol-gel PZT thin film. Piezo force microscopy amplitude is painted on top of the rendered topography. Scan size 14.5 µm. Imaged with the MFP-3D AFM.

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  • PFMAirplaneOI.jpg

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