AFM Systems
AFM Accessories
Learning
Contact Us
Lithography on sol-gel PZT thin film
Bit-mapped voltage lithography on a sol-gel PZT thin film. The piezo force microscopy phase is overlaid on top of amplitude. Scan size 20 µm. Imaged with the MFP-3D AFM.
Image courtesy of B. Gibbons, Oregon State University.
Last Updated: February 20, 2019, 5:23 pm
Category: Asylum Gallery Image