Part of the Oxford Instruments Group

PFM Lithography

Lithography on sol-gel PZT thin film 

Bit-mapped voltage lithography on a sol-gel PZT thin film. The piezo force microscopy phase is overlaid on top of amplitude. Scan size 20 µm. Imaged with the MFP-3D AFM. 

Image courtesy of B. Gibbons, Oregon State University.

Last Updated: February 20, 2019, 5:23 pm

Category: Asylum Gallery Image