Scratch nanolithography on a freestanding polystyrene film. Writing force 500 nm. Amplitude image, 10 µm scan. Imaged with the MFP-3D AFM.
Courtesy of T. Beveridge and J. Dutcher, University of Guelph.
Date: 16th November 17
Last Updated: July 12, 2018, 11:13 am
Author: Asylum Research
Category: Asylum Gallery Image
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