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AFM Topography (left), PFM amplitude overlaid on topography (middle) and PFM phase overlaid on topography (right) of an individual PVDF-TrFE nanomesa. 600 nm scan. Imaged with the MFP-3D AFM. Image courtesy of P. Sharma, T. Reece, S. Ducharme and A. Gruverman, University of Nebraska.

Date: 16th November 17

Last Updated: July 12, 2018, 11:13 am

Author: Asylum Research

Category: Asylum Gallery Image