PVDF

AFM Topography (left), PFM amplitude overlaid on topography (middle) and PFM phase overlaid on topography (right) of an individual PVDF-TrFE nanomesa. 600 nm scan. Imaged with the MFP-3D AFM. Image courtesy of P. Sharma, T. Reece, S. Ducharme and A. Gruverman, University of Nebraska.