Part of the Oxford Instruments Group

Repeated Point Defects

Successive AC mode topography images of the cleavage plane of a calcite crystal in water. The repeated point defects demonstrate the true atomic resolution capabilities of the Cypher AFM. Arrows indicate scan direction. Scan size 20 nm; Z scale 3.2 Å; Cantilever Amplitude 4 Å; Cantilever Frequency 454 kHz.

Date: 16th November 17

Last Updated: July 12, 2018, 11:13 am

Author: Asylum Research

Category: Asylum Gallery Image