Repeated point defects
Repeated Point Defects
Successive AC mode topography images of the cleavage plane of a calcite crystal in water. The repeated point defects demonstrate the true atomic resolution capabilities of the Cypher AFM. Arrows indicate scan direction. Scan size 20 nm; Z scale 3.2 Å; Cantilever Amplitude 4 Å; Cantilever Frequency 454 kHz.