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Repeated point defects

Repeated Point Defects 

Successive AC mode topography images of the cleavage plane of a calcite crystal in water. The repeated point defects demonstrate the true atomic resolution capabilities of the Cypher AFM. Arrows indicate scan direction. Scan size 20 nm; Z scale 3.2 Å; Cantilever Amplitude 4 Å; Cantilever Frequency 454 kHz.

Last Updated: June 10, 2020, 1:52 pm

Category: Asylum Gallery Image