Silicon surface impacted with molten copper droplet from exhaust of
spacecraft ion thruster, 25 µm scan. Imaged with the MFP-3D AFM.
Courtesy of S. MacLaren, University of Illinois at Urbana-Champaign.
Date: 16th November 17
Last Updated: July 12, 2018, 11:13 am
Author: Asylum Research
Category: Asylum Gallery Image
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