Part of the Oxford Instruments Group

sMIM makes higher signal-to-noise measurements

sMIM delivers at least 10X higher signal-to-noise compared to scanning capacitance microscopy (SCM) and scanning microwave microscopy (SMM). When used for dopant profiling, this sensitivity enables differentiation of dopant concentrations

Date: 16th November 17

Last Updated: July 12, 2018, 11:13 am

Author: Asylum Research

Category: Asylum Gallery Image