Part of the Oxford Instruments Group
Expand
Oxford Instruments
Applications
Products
News
Events
Contact
InvestorsCareersNewsEventsContacteCommerce
Investors Careers
AFM Systems
Jupiter XR large-sample AFM
Jupiter Family AFMJupiter XR large-sample AFM
Cypher Family AFMsCypher S AFM (base model)Cypher ES Environmental AFMCypher ES Polymer Edition AFMCypher VRS Video-Rate AFM
MFP-3D Family AFMsMFP-3D Origin low-cost AFMMFP-3D Origin+ low-cost AFMMFP-3D Infinity flagship AFMMFP-3D-BIO AFM
Accessories
bluedrive photothermal excitation option for Cypher atomic force microscopes
Cypher AccessoriesblueDrive Photothermal ExcitationMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsAFM Probes / Cantilevers
MFP-3D AccessoriesMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsSubjecting Samples to Other Driving ForcesAdapting to Your Experimental NeedsAFM Probes / Cantilevers
AFM SoftwareErgo AFM Software
Probes
Probe Stores
Americas, Australia & TaiwanEuropeChinaJapan
Probe Selection Guide
Need Help Choosing a Probe?
Applications
PolymersThin Films and CoatingsPiezo and FerroelectricsGraphene and 2D Materials
Biomolecules, Membranes, and AssembliesCells and TissuesBiomaterialsFood Science
Solar, Photovoltaics, and ThermoelectricsEnergy StorageSemiconductors and MicroelectronicsMagnetics and Data Storage
Nanomechanical CharacterizationNanoelectrical CharacterizationForce MeasurementsTribologyDevelopment of Custom AFM Instrumentation
Gallery
Application Galleries
BiologyPolymersPiezo- and FerroelectricsSolar / PhotovoltaicsElectrochemistryMagnetics and Data StorageOther Materials
Technique Galleries
Cypher Atomic ResolutionCypher blueDriveCypher Fast ScanningCypher ImagesNanomechanicsNanoelectrical MeasurementsNanolithography & NanomanipulationForce CurvesMoviesThermal TechniquesScanning Tunnelling Microscopy (STM)
Webinars
About Us
Contact Us
Sales Inquiries
Contact Your Local Sales EngineerRequest Product and Pricing Information
Customer Support
Get AFM Support NowAsk for Help on the User ForumSupport and Service Agreements
News
Events
Contact
eCommerce
  1. Learning Centre
  2. Asset

sMIM makes higher signal-to-noise measurements

sMIM delivers at least 10X higher signal-to-noise compared to scanning capacitance microscopy (SCM) and scanning microwave microscopy (SMM). When used for dopant profiling, this sensitivity enables differentiation of dopant concentrations

Date: 16th November 17

Author: Asylum Research

Category: Asylum Gallery Image

Share



© Oxford Instruments 2019

Website by Miramar Communications Ltd