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Asylum Gallery Image

sMIM makes higher signal-to-noise measurements

Author: Asylum Research

Published: 16 Nov 2017 · Last updated: 12 Jul 2018

Tags: gallery_category: Other Materials

sMIM delivers at least 10X higher signal-to-noise compared to scanning capacitance microscopy (SCM) and scanning microwave microscopy (SMM). When used for dopant profiling, this sensitivity enables differentiation of dopant concentrations

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  • sMIM-Sensitivity!.jpg

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