sMIM on carbon nanotubes

Carbon nanotubes with sMIM conductivity data overlaid on 3D topography. sMIM clearly distinguishes metallic and semi-metallic CNTs (violet) from semiconducting CNTs that only appear in topography. Courtesy E. Seabron and W. Wilson, Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign. Imaged on a MFP-3D, scan size 15 µm.