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sMIM on carbon nanotubes

Carbon nanotubes with sMIM conductivity data overlaid on 3D topography. sMIM clearly distinguishes metallic and semi-metallic CNTs (violet) from semiconducting CNTs that only appear in topography. Courtesy E. Seabron and W. Wilson, Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign. Imaged on a MFP-3D, scan size 15 ┬Ám.

Date: 16th November 17

Author: Asylum Research

Category: Asylum Gallery Image

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