Part of the Oxford Instruments Group

sMIM on carbon nanotubes

Carbon nanotubes with sMIM conductivity data overlaid on 3D topography. sMIM clearly distinguishes metallic and semi-metallic CNTs (violet) from semiconducting CNTs that only appear in topography. Courtesy E. Seabron and W. Wilson, Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign. Imaged on a MFP-3D, scan size 15 µm.

Date: 16th November 17

Last Updated: February 20, 2019, 5:23 pm

Author: Asylum Research

Category: Asylum Gallery Image