sMIM images of a SRAM sample. Though the topography and dR/dV channel show nothing unusual, the dC/dV phase image reveals a possible gate failure. Imaged on a Cypher, 2.5 µm scans.
Date: 16th November 17
Last Updated: July 12, 2018, 11:13 am
Author: Asylum Research
Category: Asylum Gallery Image
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