Part of the Oxford Instruments Group

sMIM reveals gate failure in SRAM sample

sMIM images of a SRAM sample. Though the topography and dR/dV channel show nothing unusual, the dC/dV phase image reveals a possible gate failure. Imaged on a Cypher, 2.5 µm scans.

Date: 16th November 17

Last Updated: July 12, 2018, 11:13 am

Author: Asylum Research

Category: Asylum Gallery Image