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sMIM reveals gate failure in SRAM sample

sMIM images of a SRAM sample. Though the topography and dR/dV channel show nothing unusual, the dC/dV phase image reveals a possible gate failure. Imaged on a Cypher, 2.5 ┬Ám scans.

Date: 16th November 17

Author: Asylum Research

Category: Asylum Gallery Image

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