Part of the Oxford Instruments Group
Expand

Stiffness of graphene layers on silicon dioxide substrate

Graphene layers on silicon dioxide. AM-FM image of second mode frequency, proportional to stiffness, is overlaid on topography. Imaged on a MFP-3D Origin, 2 ┬Ám scan. Sample courtesy of Fereshte Ghahari, Philip Kim, Columbia University and Dan Dahlberg, University of Minnesota.

Date: 16th November 17

Author: Asylum Research

Category: Asylum Gallery Image

Share