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Stiffness of graphene layers on silicon dioxide substrate

raphene layers on silicon dioxide. AM-FM image of second mode frequency, proportional to stiffness, is overlaid on topography. Imaged on a MFP-3D Origin, 2 µm scan. Sample courtesy of Fereshte Ghahari, Philip Kim, Columbia University and Dan Dahlberg, University of Minnesota.

Date: 16th November 17

Last Updated: July 12, 2018, 11:13 am

Author: Asylum Research

Category: Asylum Gallery Image