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Wax

Bimodal Dual AC 2nd mode amplitude overlaid on rendered AFM topography (left) and fundamental phase image overlaid on topography (right) of multi-component surf wax. Notice the high contrast visible in the bimodal Dual AC image and the relative lack of contrast in the fundamental phase. 4 ┬Ám scan. Imaged with the MFP-3D AFM.

Date: 16th November 17

Author: Asylum Research

Category: Asylum Gallery Image

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