Part of the Oxford Instruments Group
Expand

Wax

Bimodal Dual AC 2nd mode amplitude overlaid on rendered AFM topography (left) and fundamental phase image overlaid on topography (right) of multi-component surf wax. Notice the high contrast visible in the bimodal Dual AC image and the relative lack of contrast in the fundamental phase. 4 µm scan. Imaged with the MFP-3D AFM.

Date: 16th November 17

Last Updated: February 20, 2019, 5:23 pm

Author: Asylum Research

Category: Asylum Gallery Image

Share