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Bimodal Dual AC 2nd mode amplitude overlaid on rendered AFM topography (left) and fundamental phase image overlaid on topography (right) of multi-component surf wax. Notice the high contrast visible in the bimodal Dual AC image and the relative lack of contrast in the fundamental phase. 4 µm scan. Imaged with the MFP-3D AFM.
Date: 16th November 17
Author: Asylum Research
Category: Asylum Gallery Image