Fundamental resonance mode phase overlaid on the rendered
topography (left) and second resonance mode amplitude (Dual AC Mode) overlaid on the topography, 1 µm scan. Imaged with the MFP-3D AFM.
Date: 16th November 17
Last Updated: February 20, 2019, 5:23 pm
Author: Asylum Research
Category: Asylum Gallery Image
© Oxford Instruments 2022