Torsional Force Microscopy of Twisted 2D Materials

Torsional Force Microscopy of Twisted 2D Materials

Determining the twist angle of stacked 2D materials by imaging the moiré periodicity is a critical step in the fabrication and characterization of these materials. But some AFMs struggle to consistently image it. Here, we show how Torsional Force Microscopy (TFM) on the Jupiter Discovery AFM makes it simple for everyone. The ultra-low noise and high-speed imaging of the Jupiter Discovery makes these measurements quick and routine. 

TFM is available on Jupiter, Cypher, and Vero A