Learn About AFM Tools to Evaluate Local Electrical Properties

(Free download, compliments of Asylum Research, the Technology Leader in Atomic Force Microscopy)

Learn about techniques to characterize:

• Current (<1 pA to 10 µA) and conductivity
• Nanoscale time-dependent dielectric breakdown
• Electrical field gradients (e.g. trapped charge)
• Surface potential and work function
• Resistance, capacitance, dC/dV, and dR/dV

See actual examples on materials including:

• Ferroelectric materials
• Semiconducting polymer films
• Failure analysis on memory devices
• Photovoltaic film containing carbon nanotubes
• Production of 2D materials (e.g. graphene and MoS₂)
• Next-gen devices based on 2D materials
• Optoelectronic materials