Part of the Oxford Instruments Group

Learn About AFM Tools to Evaluate Local Electrical Properties

As devices shrink and new nanomaterials emerge, AFM has become an essential tool in their development, production, and failure analysis

Learn about techniques to characterize:

  • Current (<1 pA to 10 µA) and conductivity
  • Nanoscale time-dependent dielectric breakdown
  • Electrical field gradients (e.g. trapped charge)
  • Surface potential and work function
  • Resistance, capacitance, dC/dV, and dR/dV

See actual examples on materials including:

  • Ferroelectric materials
  • Semiconducting polymer films
  • Failure analysis on memory devices
  • Photovoltaic film containing carbon nanotubes
  • Production of 2D materials (e.g. graphene and MoS2)
  • Next-gen devices based on 2D materials
  • Optoelectronic materials
Download Now