Part of the Oxford Instruments Group
Expand
Oxford Instruments
Applications
Products
News
Events
Contact
InvestorsCareersNewsEventseCommerce
Investors Careers
AFM Systems
Cypher atomic force microscope family thumbnail
Cypher Family AFMsCypher S AFM (base model)Cypher ES Environmental AFMCypher ES Polymer Edition AFMCypher VRS Video-Rate AFM
MFP-3D atomic force microscope family thumbnail
MFP-3D Family AFMsMFP-3D Origin low-cost AFMMFP-3D Origin+ low-cost AFMMFP-3D Infinity flagship AFMMFP-3D-BIO AFM
Accessories
bluedrive photothermal excitation option for Cypher atomic force microscopes
Cypher AccessoriesblueDrive Photothermal ExcitationMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsAFM Probes / Cantilevers
MFP-3D AccessoriesMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsSubjecting Samples to Other Driving ForcesAdapting to Your Experimental NeedsAFM Probes / Cantilevers
Probes
Probe Stores
Americas, Australia & TaiwanEuropeChinaJapan
Applications
PolymersThin Films and CoatingsPiezo and FerroelectricsGraphene and 2D Materials
Biomolecules, Membranes, and AssembliesCells and TissuesBiomaterialsFood Science
Solar, Photovoltaics, and ThermoelectricsEnergy StorageSemiconductors and MicroelectronicsMagnetics and Data Storage
Nanomechanical CharacterizationNanoelectrical CharacterizationForce MeasurementsTribologyDevelopment of Custom AFM Instrumentation
Gallery
Application Galleries
BiologyPolymersPiezo- and FerroelectricsSolar / PhotovoltaicsElectrochemistryMagnetics and Data StorageOther Materials
Technique Galleries
Cypher Atomic ResolutionCypher blueDriveCypher Fast ScanningCypher ImagesNanomechanicsNanoelectrical MeasurementsNanolithography & NanomanipulationForce CurvesMoviesThermal TechniquesScanning Tunnelling Microscopy (STM)
Webinars
About Us
Contact Us
Sales Support
Contact Your Local Sales EngineerRequest Product and Pricing Information
Product and Applications Support
Get AFM Support NowAsk for Help on the User ForumSupport and Warranty Policies
News
Events
Contact
Explore OI

Asylum AFMs Study Materials Under Variable Applied Magnetic Fields

Magnetic nanostructures are a vibrant field of research, not only for data storage but also for next-generation logic elements. Learn how magnetic force microscopy (MFM) under applied magnetic fields is enabling new insights.

Learn about Asylum AFM tools for MFM:

  • Operating principles of magnetic force microscopy
  • Capabilities of the Variable Field Module for both in-plane and out-of-plane magnetic fields
  • Automation of MFM measurements using scripting to capture domain evolution as a function of the applied magnetic field strength

These capabilities are illustrated by two case studies:

  • Systematic study of domain structure in a Co/Ni thin film that exhibits perpendicular magnetic anisotropy (PMA)
  • Direct observation of magnetic skyrmions under applied fields, a feat previously only possible with costly, time-consuming scanning x-ray transmission microscopy (STXM) at a synchrotron facility
Download

© Oxford Instruments 2018

Website by Miramar Communications Ltd