Part of the Oxford Instruments Group
Expand
Oxford Instruments
Applications
Products
News
Events
Contact
SustainabilityInvestorsCareersNewsEvents
Investors Careers
AFM Systems
Jupiter XR large-sample AFM
Jupiter Family AFMJupiter XR large-sample AFM
Cypher Family AFMsCypher S AFM (base model)Cypher ES Environmental AFMCypher ES Polymer Edition AFMCypher VRS Video-Rate AFM
MFP-3D Family AFMsMFP-3D Origin low-cost AFMMFP-3D Origin+ low-cost AFMMFP-3D Infinity flagship AFMMFP-3D-BIO AFM
Accessories
Jupiter AccessoriesPolyHeaterCoolerHeaterImaging in LiquidConductive AFMScanning Capacitance Microscopy (SCM)
Cypher AccessoriesblueDrive Photothermal ExcitationMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsAFM Probes / Cantilevers
MFP-3D AccessoriesMeasuring Nanomechanical and Thermal PropertiesMeasuring Nanoelectrical and Electrochemical PropertiesControlling Temperature and Gas EnvironmentOperating in Liquid EnvironmentsSubjecting Samples to Other Driving ForcesAdapting to Your Experimental NeedsAFM Probes / Cantilevers
AFM SoftwareErgo AFM SoftwareRelate: software for correlative imaging with AFM, EM, EDS, and EBSD
Probes
Probe Stores
US & CanadaEuropeAsiaLatin America, New Zealand, Hong Kong, UAE, Saudi ArabiaChinaJapan
Probe Selection Guide
Need Help Choosing a Probe?
Applications
PolymersThin Films and CoatingsPiezo and FerroelectricsGraphene and 2D Materials
Biomolecules, Membranes, and AssembliesCells and TissuesBiomaterialsFood Science
Solar, Photovoltaics, and ThermoelectricsEnergy StorageSemiconductors and MicroelectronicsMagnetics and Data Storage
Nanomechanical CharacterizationNanoelectrical CharacterizationForce MeasurementsTribologyDevelopment of Custom AFM Instrumentation
Learning
Case Studies
Webinars
Image GalleryPolymersBiologySemiconductors and MicroelectronicsGraphene & 2D MaterialsSolar
About Us
Contact Us
Sales Inquiries
Contact Your Local Sales EngineerRequest Product and Pricing Information
Customer Support
Get AFM Support NowAsk for Help on the User ForumSupport and Service Agreements
Shop
UKEuropeUS & CanadaJapanAsiaChina
Our Asia Online Store is live. Visit for consumables, spares, software and training. Launching soon: Japan
News
Events
eCommerce

Learn how the Interferometric Displacement Sensor (IDS) Option for Asylum Research Cypher AFMs "Quantifies the Last Axis"

Quantitative, calibration-free deflection measurements eliminate key artifacts and improve reproducibility of PFM and dynamic measurement modes

Improved measurement reproducibility for electromechanical response in piezo- and ferro- electric materials

  • Electromechanical measurements are free of frequency-dependent artifacts
  • Correctly measures 180° phase shift across oppositely polarized domains

Accurate Spring Constant Calibration

  • Accurately measures the spring constant of any eigenmode up to 2.5 MHz.
  • Does not require any assumptions or measurements of cantilever mode shapes because the IDS sensitivity requires no calibration

Cantilever Mode Shape Mapping

  • Allows direct measurement of cantilever modes shapes in any medium
  • Unlike modeling, mode mapping with the IDS does not require any assumptions about the cantilever shape and properties
Download Now

© Oxford Instruments 2021

Website by Miramar Communications Ltd