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Learn how the Interferometric Displacement Sensor (IDS) Option for Asylum Research Cypher AFMs "Quantifies the Last Axis"
Quantitative, calibration-free deflection measurements eliminate key artifacts and improve reproducibility of PFM and dynamic measurement modes
(Free download, compliments of Asylum Research, the Technology Leader in Atomic Force Microscopy)
Improved measurement reproducibility for electromechanical response in piezo- and ferro- electric materials
Electromechanical measurements are free of frequency-dependent artifacts
Correctly measures 180° phase shift across oppositely polarized domains
Accurate Spring Constant Calibration
Accurately measures the spring constant of any eigenmode up to 2.5 MHz.
Does not require any assumptions or measurements of cantilever mode shapes because the IDS sensitivity requires no calibration
Cantilever Mode Shape Mapping
Allows direct measurement of cantilever modes shapes in any medium
Unlike modeling, mode mapping with the IDS does not require any assumptions about the cantilever shape and properties
Download Now
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