Nanotribology with the Atomic Force Microscope (AFM)

Nearly a quarter of the world’s annual energy consumption is spent overcoming friction and repairing damage caused by wear. Developing methods to reduce friction can thus reap massive economic and environmental benefits. The force sensitivity and high spatial resolution of the atomic force microscope (AFM) have made it indispensable for studying nanotribology.

This app note describes:

• The capabilities and benefits of today’s AFMs for nanotribological characterization
• How the AFM measures friction with lateral force microscopy (LFM), also known as friction force microscopy (FFM)
• How AFM studies have proven beneficial in engineering biomedical interfaces
• How AFM studies have helped reduce friction in MEMS/NEMS devices

(Free download, compliments of Asylum Research, the Technology Leader in Atomic Force Microscopy)