Vero: Interferometric AFM

The Vero atomic force microscope is a next-generation AFM that precisely and accurately measures true tip displacement using Quadrature Phase Differential Interferometry (QPDI). Built on the unrivaled stability and performance of the Cypher AFM family, this unique patented QPDI innovation enables Vero to provide AFM results with higher accuracy, precision, and repeatability.

Measures true tip displacement.
Improves measurement sensitivity.
Avoids crosstalk between vertical and in-plane forces.
Is precisely calibrated by the wavelength of light.
Available in S and ES configurations.

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Download Vero Datasheet

Vero Datasheet

Vero Application Note:
Accuracy

Vero Application Note:
Precision

Vero Technical Note

Measures true tip displacement

QPDI directly measures true tip displacement instead of cantilever angle, enabling improved quantification of many AFM measurements.

Improves measurement sensitivity

QPDI lowers cantilever detection noise by a factor of up to 10× or more on many cantilevers, enabling improved measurement sensitivity.

Avoids crosstalk between vertical and in-plane forces

Only QPDI measures pure vertical tip displacement, avoiding the large crosstalk between OBD vertical and lateral deflection signals.

Is precisely calibrated by the wavelength of light

Interferometric detection avoids the assumptions and uncertainties associated with OBD calibration.

Included Operating Modes

Contact mode
DART PFM
Dual AC
Dual AC Resonance Tracking (DART)
Electric force microscopy (EFM)
Force curves
Force mapping mode (force volume)
Force modulation
Frequency modulation
Kelvin probe force microscopy (KPFM)
Lateral force mode (LFM)
Loss tangent imaging
Magnetic force microscopy (MFM)
Nanolithography and nanomanipulation
Phase imaging
Piezoresponse force microscopy (PFM)
Switching spectroscopy PFM
Tapping mode (AC mode)
Vector PFM

Optional Operating Modes

AM-FM Viscoelastic Mapping Mode
Contact Resonance Viscoelastic Mapping Mode
Fast Force Mapping Mode (FFM)
Conductive AFM (CAFM)
Current mapping with FFM
Electrochemical Strain Microscopy (ESM)
High voltage PFM
Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)
Scanning Capacitance Microscopy (SCM)
Scanning tunneling microscopy (STM)

Nanomechanical and Thermal Properties

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Nanoelectrical and Electrochemical Properties

Tools for measuring electrical properties, including current, resistivity and permittivity, and more. Also includes PFM, STM, and EC-AFM techniques.

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Temperature and Other Environmental Control

Accessories for controlling temperature, the gas environments (gas/vapor composition or humidity), and operating under ultra-low oxygen and/or water levels in a glovebox.

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Operating in Liquid Environments

Accessories for operation in controlled liquid environments, with or without perfusion. The blueDrive photothermal excitation option is also under this accessory family.

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Support and Service Agreements

More than just an extended warranty, these packages provide peace of mind that your AFM is operating at peak performance and offer training opportunities for users.