The Vero atomic force microscope is a next-generation AFM that precisely and accurately measures true tip displacement using Quadrature Phase Differential Interferometry (QPDI). Built on the unrivaled stability and performance of the Cypher AFM family, this unique patented QPDI innovation enables Vero to provide AFM results with higher accuracy, precision, and repeatability.
Measures true tip displacement.
Improves measurement sensitivity.
Avoids crosstalk between vertical and in-plane forces.
Is precisely calibrated by the wavelength of light.
Available in S and ES configurations.
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