Part of the Oxford Instruments Group

Vero: Interferometric AFM

The Vero atomic force microscope is a next-generation AFM that precisely and accurately measures true tip displacement using Quadrature Phase Differential Interferometry (QPDI). Built on the unrivaled stability and performance of the Cypher AFM family, this unique patented QPDI innovation enables Vero to provide AFM results with higher accuracy, precision, and repeatability.

  • Measures true tip displacement.

  • Improves measurement sensitivity.

    • Avoids crosstalk between vertical and in-plane forces.

      • Is precisely calibrated by the wavelength of light.

        • Available in S and ES configurations.

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        Download Vero Datasheet
        Vero Datasheet

        Measures true tip displacement

        • QPDI directly measures true tip displacement instead of cantilever angle, enabling improved quantification of many AFM measurements.

        Improves measurement sensitivity

        • QPDI lowers cantilever detection noise by a factor of up to 10× or more on many cantilevers, enabling improved measurement sensitivity.

        Avoids crosstalk between vertical and in-plane forces

        • Only QPDI measures pure vertical tip displacement, avoiding the large crosstalk between OBD vertical and lateral deflection signals.

        Is precisely calibrated by the wavelength of light

        • Interferometric detection avoids the assumptions and uncertainties associated with OBD calibration.

        Included Operating Modes

        Contact mode
        DART PFM
        Dual AC
        Dual AC Resonance Tracking (DART)
        Electric force microscopy (EFM)
        Force curves
        Force mapping mode (force volume)
        Force modulation
        Frequency modulation
        Kelvin probe force microscopy (KPFM)
        Lateral force mode (LFM)
        Loss tangent imaging
        Magnetic force microscopy (MFM)
        Nanolithography and nanomanipulation
        Phase imaging
        Piezoresponse force microscopy (PFM)
        Switching spectroscopy PFM
        Tapping mode (AC mode)
        Vector PFM

        Optional Operating Modes

        AM-FM Viscoelastic Mapping Mode
        Contact Resonance Viscoelastic Mapping Mode
        Fast Force Mapping Mode (FFM)
        Conductive AFM (CAFM)
        Current mapping with FFM
        Electrochemical Strain Microscopy (ESM)
        High voltage PFM
        Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)
        Scanning Capacitance Microscopy (SCM)
        Scanning tunneling microscopy (STM)

        Related Applications

        Mechanical and Electrical PropertiesCharacterisation of Low Dimensional StructuresPiezo and FerroelectricsGraphene and 2D MaterialsNanomaterials and NanostructuresCoatings & Thin FilmsMaterials ScienceNano-Carbon & 2D MaterialsMagnetics Ferro- & Piezo - electrics

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