Part of the Oxford Instruments Group

Asylum Research Webinar: Asylum AFM Tools for Characterizing 2D Materials



Dr. Andras Kis of EPFL Institute of Electrical Engineering and Keith Jones, Asylum Research's nanoelectrical characterization specialist, are your hosts. They discuss the integral role of AFM in 2D materials research and present tools and techniques to successfully characterize a variety of 2D materials used for device manufacturing, energy storage and optoelectronics. Learn about AFM modes for mapping physical properties and see how they can evaluate local electrical, mechanical and functional response. They also discuss how AFM can now be used to accurately determine the thickness of single or multiple layers of a 2D material, challenging a common misconception.

Included are results on the following studies:

  • Molybdenum disulfide (MoS2) and graphene
  • Measurements of mechanical properties
  • Kelvin probe imaging (KPFM) of operating transistors
  • Electrical characterization
  • Detailed discussions of these modes:
    • KPFM
    • Piezoresponse force microscopy (PFM)
    • Conductive AFM
    • Scanning microwave impedance imaging (sMIM)

About Your Lecturers:

Andras Kis is an Associate Professor at Ecole Polytechnique Federale de Lausanne (EPFL), School of Engineering (STI), Institute of Electrical Engineering (IEL) with a research focus in developing 2D materials. His group demonstrated the first transistor based on a 2D semiconductor. He has more than 16 years of AFM experience, including 63 peer-reviewed papers, more than 50 invited talks at scientific meetings, and participation in organization committees for numerous 2D materials and graphene conferences. He has also been the editor-in-chief for Nature Partner Journal, “2D Materials and Applications”. Prof. Kis received his PhD from EPFL and did his post doc at Univ. of California Berkeley, Zettl Lab.

Keith Jones is an Application Scientist at Oxford Instruments Asylum Research (12 years). He has more than 18 years of SPM experience specializing in nanoelectrical characterization and was instrumental in developing and applying electrical AFM techniques, such as dopant profiling and scanning microwave impedance microscopy. Keith is also a co-inventor on a patent for scanning impedance microscopy and has co-authored 34 published papers. Keith received his M.S. in Physics at Virginia Commonwealth University.

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