Asylum Research Webinar: AFM Characterization of Emerging Photovoltaics

Description

The atomic force microscope (AFM) provides unique capabilities for nanoscale characterization of photovoltaic materials and devices. It can probe local electrical and functional response in light or dark conditions with environmental control, and map surface structure with unprecedented resolution. In this webinar, we provide an overview of AFM applications for emerging photovoltaics including hybrid organic-inorganic perovskites and organic semiconductors. Our guest speaker, Dr. Rajiv Giridharagopal, discusses results using standard and advanced modes such as photoconductive AFM, piezoresponse force microscopy (PFM), and time-resolved electrostatic force microscopy. Additional results are presented to further illustrate the power and versatility of AFMs for photovoltaic R&D.

Key learning objectives:

• Learn how nanoscale imaging reveals structure-property relations in crystalline perovskites and bulk heterojunction polymers

• Discover the latest AFM techniques to accurately map local photocurrent, work function, and other electrical response in photoactive materials and charge transport layers

• See real-world results from leading researchers in the field on a variety of photovoltaic systems using standard and advanced AFM techniques

• Learn how AFM has become simpler with turnkey instrumentation for better AFM optical experiment

  About Your Lecturers:

Dr. F. Ted Limpoco, Oxford Instruments Asylum Research

Dr. Rajiv Giridharagopal, The Ginger Group Lab, University of Washington-Seattle