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Asylum Research Webinar Series
 

Description

Probe selection is one of the most important considerations in atomic force microscopy. There is a wide breadth of AFM scanning modes currently available, as well as a number of imaging conditions to study your sample.

With all of the probes available, how do you choose the right one?

There isn't a one-size-fits-all solution for choosing the right AFM probe. How do you determine which one is right for your experiment? Even for a skilled user, choosing the right probe can be daunting. From hours of unproductive work, to sample contamination or damage, employing an inappropriate probe can prove disastrous.

Gain the benefit of experienced AFM users to show you how.

This webinar aims to make you an expert at selecting the right probe to match your AFM experiment, no matter what your skill level may be. Our team of applications scientists have scanned many types of materials and bio samples using different modes, conditions and probes. In this Webinar, I'll share our knowledge and experiences.

TOPICS:

  • Probe fundamentals (spring constant, tip radius, quality factor, resonant frequency)
  • Overview of calibration
  • Selecting probes for imaging in air or liquid
  • Selecting probes for special modes and materials
  • High resolution imaging
  • Magnetic characterization
  • Measurements that depend on contact resonance
  • Specialized tips (diamond, carbon nanotubes, or high aspect ratio tips)
  • Real-world examples for materials and biology applications

About Your Lecturer:

F. Ted Limpoco, Ph.D., Chemistry Applications Scientist, Oxford Instruments Asylum Research

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