The Vero Interferometric AFM: Improvements in Accuracy and Precision

Description

Vero is the next-generation AFM from Oxford Instruments Asylum Research. Building on its flagship Cypher AFM platform, Vero is the first commercial AFM to use a patented Quadrature Phase Differential Interferometry (QPDI) detector to provide unprecedented performance without compromise in terms of accuracy, range, and noise. Interferometric atomic force microscopes (AFM) mark the next step in the evolution of AFM design, with improvements in both accuracy and precision. We will discuss how Vero’s QPDI detector provides inherent immunity to common artifacts and sources of measurement error for improved accuracy. In addition, we will discuss the QPDI detector’s improvement in noise for improved measurement precision.

About Your Speakers

Ben Ohler is Senior Product Line Manager for the Cypher family of AFMs at Asylum Research. He received his Ph.D. in chemical engineering from the University of California Santa Barbara. He has worked as an applications scientist and in product marketing in the AFM industry for the past 23 years and for the last 10 years at Asylum Research.

Jason Li has more than two decades of AFM expertise and graduated from Stanford University with undergraduate and graduate degrees in Mechanical Engineering and Materials Science and Engineering, respectively. He joined Asylum Research more than 20 years ago and has been involved with many aspects of the business throughout his career.