Part of the Oxford Instruments Group

Demo the new Asylum Research Jupiter XR Large Sample AFM May 23, 2019 and June 6, 2019

Demo Jupiter XR AFM—
A new large-sample AFM imaging for improved resolution, speed and operation 

May 23 at the University of Wisconsin

June 6 at the University of Illinois Urbana-Champaign

The new Jupiter XR Atomic Force Microscope is the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner. Jupiter provides complete 200 mm sample access and delivers higher resolution, faster results, a simpler user experience, and the versatility to excel in both academic research and industrial R&D laboratories.

Who should attend?

Both experienced AFM users as well as less experienced researchers who would like to learn more about how AFM could impact their projects.

Schedule your demo

The AFM Demo on May 23 and June 6 is free, but all attendees must sign up due to limited seating. Please choose just one of the time slots for your Jupiter XR demonstration.

If you would like to bring your samples, please indicate your interest when registering and you will be contacted to discuss your sample and schedule a time.


May 23
University of Wisconsin - Madison

1415 Engineering Drive
Madison, WI 53706-1607
Room 105

Campus Map

June 6
Materials Research Laboratory
University of Illinois at Urbana-Champaign
104 South Goodwin Avenue
Urbana, IL 61801
Room MRL 0014

Campus Map


Schedule Your Demo

Images left to right:  Epitaxial silicon, insulated gate of a bipolar transistor, polymer blend, sol-gel piezoelectric thin film.