Demo the new Asylum Research Jupiter XR Large Sample AFM  at UIUC's Advanced Materials Characterization Workshop, June 4-6

Demo Jupiter XR AFM—
A new large-sample AFM imaging for improved resolution, speed and easy operation 

June 4-6, University of Illinois Urbana-Champaign, Rm MRL 004

The new Jupiter XR Atomic Force Microscope is the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner. Jupiter provides complete 200 mm sample access and delivers higher resolution, faster results, a simpler user experience, and the versatility to excel in both academic research and industrial R&D laboratories.

Who should attend?

Experienced AFM users as well as less experienced researchers are invited. You will see and learn how an entirely new, easy-to-use large sample AFM can impact your research.

Schedule your demo

The Jupiter XR AFM will be setup during the Advanced Materials Characterization Workshop, June 4-5, with individual demos available on June 6. Please choose the UIUC location when registering for your Jupiter XR demonstration.  If you would like to bring your own samples, please indicate your interest when registering and you will be contacted to discuss your sample and schedule a time. Slots are limited.

Venue

Materials Research Laboratory
University of Illinois at Urbana-Champaign
104 South Goodwin Avenue
Urbana, IL 61801
Room MRL 0014

Campus Map

Images left to right:  Epitaxial silicon, insulated gate of a bipolar transistor, polymer blend, sol-gel piezoelectric thin film.