The Jupiter XR Atomic Force Microscope is the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner. Jupiter provides complete 200 mm sample access and delivers higher resolution, faster results, a simpler user experience, and the versatility to excel in both academic research and industrial R&D laboratories.
Higher resolution than any other large-sample AFM
Extended range 100 μm scanner is 5-20× faster than most other AFMs
From setup to results, every step is simpler and faster
Modular design adapts to your needs for maximum flexibility
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