The Jupiter XR Atomic Force Microscope is the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner. Jupiter provides complete 200 mm sample access and delivers higher resolution, faster results, a simpler user experience, and the versatility to excel in both academic research and industrial R&D laboratories.
Higher resolution than any other large-sample AFM
Extended range 100 μm scanner is 5-20× faster than most other AFMs
From setup to results, every step is simpler and faster
Modular design adapts to your needs for maximum flexibility
Dual AC Resonance Tracking (DART)
Electrostatic Force Microscopy (EFM)
Force Mapping Mode (force volume)
Kelvin Probe Force Microscopy (KPFM)
Lateral Force Mode (LFM)
Loss tangent imaging
Magnetic Force Microscopy (MFM)
Piezoresponse Force Microscopy (PFM)
Switching spectroscopy PFM
Tapping mode (AC mode)
Tapping mode with digital Q control
AM-FM Viscoelastic Mapping Mode
Contact Resonance Viscoelastic Mapping Mode
Conductive AFM (CAFM) with ORCA™ and Eclipse™ Mode
Current mapping with Fast Force Mapping
Electrochemical Strain Microscopy (ESM)
Fast Force Mapping Mode
High voltage PFM
Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)
Nanoscale Time Dependent Dielectric Breakdown experiements up to ±150 V.
Conductive AFM imaging with the new ORCA cantilever holder.
Capacitance measurements down to 1 aF accompanied by high resolution imaging and fast scanning.
High voltage operation up to ±150 V.
Droplet imaging with the new liquid cantilever holder.
Sub-zero temperature control with the CoolerHeater accessory.
Force curve-based nanomechanical mapping mode.
Variation of magnetic field: in-plane and out-of-plane of the sample.
Sample heating up to 300°C with the PolyHeater accessory.
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