Distinguishing ABA- and ABC-Stacked Trilayer Graphene with Atomic Force Microscopy

Research on graphene systems and other 2D materials requires tools for identifying the stacking order with sufficient spatial resolution. 2D Raman spectroscopy and IR-SNOM both have limitations, while SKPM and SCM, both standard modes on Oxford Instruments Asylum Research atomic force microscopes, can easily distinguish the differences between ABA and ABC graphene configurations.

Download the application note to learn about:

• How Scanning Probe Kelvin Microscopy (SKPM) can measure surface potential to distinguish between ABA and ABC graphene
• How Asylum Research’s new Scanning Capacitance Microscopy (SCM) mode, with its higher sensitivity, can help distinguish between ABA and ABC graphene
• The limitations of 2D Raman spectroscopy and IR-SNOM for distinguishing between ABA and ABC graphene

(Free download, compliments of Asylum Research, the Technology Leader in Atomic Force Microscopy)