Learn How to Probe Samples Under Applied Magnetic Fields
The latest Variable Field Module (VFM4) for MFP-3D atomic force microscopes can apply both in-plane and out-of-plane magnetic fields
Learn about the features and benefits of the VFM4:
- Apply in-plane magnetic fields up to ±8000 G
- Apply out-of-plane magnetic fields up to ±1200 G
- Field strength is adjustable from software
- Unique design using permanent magnets eliminates the heating and drift associated with electromagnets
You might also be interested in our recent application note, "Magnetic Force Microscopy Under Applied Perpendicular Fields with Asylum Research AFMs." It discusses two case studies: 1) Domain structure in a Co/Ni thin film that exhibits perpendicular magnetic anisotropy, and, 2) Direct observation of magnetic skyrmions under applied fields.