Part of the Oxford Instruments Group

Electrical Probe Station

The Probe Station attaches to the MFP-3D scanner and allows easy electrical probing of samples, electrical biasing, and other measurements while the sample is being scanned with the AFM. A variety of electrical connections can be made and combined with various imaging modes.

  • Allows easy electrical probing while the sample is being scanned
  • Easily attaches to the MFP-3D stage

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