Part of the Oxford Instruments Group

NanoRack Sample Stretching Stage

Extract new information from your samples with the NanoRack™. This unique sample stage applies symmetric tensile or compressive loading to samples about a central area that can be simultaneously observed with the AFM. The stage features a large range to achieve high strains and an integrated load cell to measure high stresses with forces up to 80 N. (Compatible with all MFP-3D AFMs except Origin. Also compatible with Jupiter XR AFM.)

  • High-strain, high-travel manual stretching stage provides two axis tensile stress control
  • Returns both stress and strain data
  • Can be used under tension or compression
  • Allows control of the sample image region under different loads

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