This webcast will begin with a brief introduction to the many capabilities that Atomic Force Microscopy (AFM) provides for 2D materials research, illustrated by examples from recent research to provide a broad overview of how AFM is helping to advance our understanding of these materials.
You will learn advanced methods to study interfacial structures and properties of graphene and beyond.
Dr. Zhihai Cheng, Professor of Physics at Renmin University of China, will then present results from several of his group’s research projects on the interfacial structures and properties of 2D Materials, including a study of strain-induced anisotropic shear behaviour, visualization and effects of water-intercalation at the homo-/hetero-interfaces, and interfacial strain-induced patterned mechanical and electronical structures at a MoS2/SiO2 and WS2/SiO2 interface.
You will learn how AFM can:
Dr. Ted Limpoco - Applications Scientist, Oxford Instruments Asylum Research Inc.
Dr. Zhihai Cheng - Professor of Physics, Renmin University of China
Dr. Jayshan Carpen - Moderator, Nature Research