The Vero Interferometric AFM: Advances in Precision

Check out this new article on the Vero Interferometric AFM featured in Microscopy and Analysis magazine!

Vero is a next generation atomic force microscope (AFM) that uses a patented Quadrature Phase Differential Interferometry (QPDI) detection system to precisely and accurately measure true tip displacement. This innovation challenges the AFM status quo with significant improvements in accuracy, precision, sensitivity, and repeatability.

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Diagram of the QPDI principle used to measure cantilever displacement in an AFM. A light beam is split into two beams that are focused onto the cantilever and the backside of the chip.  A quadrature phase analyzer measures the difference in the distance travelled  by both beams to determine the displacement of the cantilever. A full 2π cycle in phase is equivalent to a λ/2 displacement, and multiple cycles may.