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Cypher S AFM

The Asylum Research Cypher S is the base model of the Cypher AFM family. The Cypher S was the first commercially available fast-scanning AFM, and the Cypher family AFMs remain the only full-featured fast-scanning AFMs that are compatible with a complete range of modes and accessories. Cypher AFMs have also earned a reputation for easily achieving higher resolution than other AFMs. The Cypher S is a great AFM for both materials science and life science research for ambient measurements in both air and liquids. The Cypher S is fully upgradable later for environmental control options or even video-rate scanning.

  • Routinely achieve higher resolution than other AFMs
  • Fast scanning with results in seconds instead of minutes
  • Every step of operation is simpler for remarkable productivity
  • Small footprint in the lab, huge potential to grow in capability
  • Support that goes above and beyond your expectations


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Cypher Family Brochure

Routinely achieve higher resolution than other AFMs

  • Unmatched mechanical stability—noise floor half  that of any other AFM
  • Exceptionally low drift—higher resolution and straight lattice lines
  • Low noise electronics—no artifacts from electronic noise sources

Fast scanning with results in seconds instead of minutes

  • Scans 10-100× faster than typical AFMs
  • Supports the fastest, smallest probes (3×9 µm spot size—optional)
  • Fast scanning that goes beyond topography—also nanomechanics, CAFM, PFM

Every step of operation is simpler for remarkable productivity

  • ModeMaster™ automatically configures software for selected mode
  • SpotOn™ makes the fully motorized laser and detector alignment one-click
  • GetReal™ automatically calibrates the cantilever spring constant and sensitivity
  • GetStarted™ automatically sets optimal parameters for tapping mode imaging
  • blueDrive™ makes tapping mode simpler, more stable, and more quantitative

Small footprint in the lab, huge potential to grow in capability

  • Full suite of nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus)
  • Unmatched range of nanoelectrical and electromechanical characterization modes
  • Upgradeable to the Cypher ES for environmental control accessories and to Cypher VRS for video-rate imaging
  • Many standard operating modes and even more optional modes

Support that goes above and beyond your expectations

  • Includes a standard two-year comprehensive warranty
  • No-charge technical support and expert applications support for life
  • Extended warranty and repair costs are the lowest in the industry

Included Operating Modes

Contact mode
DART PFM
Dual AC
Dual AC Resonance Tracking (DART)
Electrostatic Force Microscopy (EFM)
Force curves
Force Mapping Mode (force volume)
Force modulation
Frequency modulation
Kelvin Probe Force Microscopy (KPFM)
Lateral Force Mode (LFM)
Loss tangent imaging
Magnetic Force Microscopy (MFM)
Nanolithography
Nanomanipulation
Phase imaging
Piezoresponse Force Microscopy (PFM)
Switching spectroscopy PFM
Tapping mode (AC mode)
Tapping mode with digital Q control
Vector PFM

Optional Operating Modes

AM-FM Viscoelastic Mapping Mode
Contact Resonance Viscoelastic Mapping Mode
Conductive AFM (CAFM) with ORCA™ and Eclipse™ Mode
Current mapping with Fast Force Mapping
Electrochemical Strain Microscopy (ESM)
Fast Force Mapping Mode
High voltage PFM
Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)
Scanning Microwave Impedance Microscopy (sMIM)
Scanning Tunneling Microscopy (STM)

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