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The Asylum Research Cypher S is the base model of the Cypher AFM microscope family. The Cypher S was the first commercially available fast-scanning AFM, and the Cypher family AFMs remain the only full-featured fast-scanning AFMs that are compatible with a complete range of modes and accessories. Cypher AFMs have also earned a reputation for easily achieving higher resolution than other AFMs. The Cypher S is a great AFM for both materials science and life science research for ambient measurements in both air and liquids. The Cypher S is fully upgradable later for environmental control options or even video-rate scanning.
Routinely achieve higher resolution than other AFM microscopes
Contact mode
DART PFM
Dual AC
Dual AC Resonance Tracking (DART)
Electrostatic Force Microscopy (EFM)
Force curves
Force Mapping Mode (force volume)
Force modulation
Frequency modulation
Kelvin Probe Force Microscopy (KPFM)
Lateral Force Mode (LFM)
Loss tangent imaging
Magnetic Force Microscopy (MFM)
Nanolithography
Nanomanipulation
Phase imaging
Piezoresponse Force Microscopy (PFM)
Switching spectroscopy PFM
Tapping mode (AC mode)
Tapping mode with digital Q control
Vector PFM
AM-FM Viscoelastic Mapping Mode
Contact Resonance Viscoelastic Mapping Mode
Conductive AFM (CAFM) with ORCA™ and Eclipse™ Mode
Current mapping with Fast Force Mapping
Electrochemical Strain Microscopy (ESM)
Fast Force Mapping Mode
High voltage PFM
Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)
Scanning Microwave Impedance Microscopy (sMIM)
Scanning Tunneling Microscopy (STM)