MFP-3D Accessories: Nanoelectrical Properties

The ORCA™ Conductive AFM probe holder provides conductive AFM imaging and I-V measurement capabilities for all MFP-3D AFMs. The standard module is capable of measuring currents from…

The Piezo Force Module enables operation at high tip biases up to ±220 V for very high sensitivity and crosstalk-free measurements on piezoelectrics, including ferroelectrics and multiferroics…

The Electrochemistry Cell (EC Cell) enables in situ studies of deposition, oxidation, corrosion, and mass transfer of metals and other materials. The cell can be operated in a fully…

sMIM enables nanoscale permittivity and conductivity mapping on metals, semiconductors, and insulators (compatible with all MFP-3D AFMs except Origin).

NanoTDDB™ enables characterization of dielectric breakdown with nanoscale precision. Constant or ramped biases up to ±220 V can be applied while monitoring current through a conductive…

STM can be useful for high resolution imaging of conductive samples on MFP‑3D systems.

ESM is a novel scanning probe microscopy technique that is capable of probing electrochemical reactivity and ionic flows in solids with unprecedented resolution. (Available on all MFP-3D…