Cypher Accessories: Nanoelectrical Properties

Kelvin Probe Force Microscopy is used to image a sample’s electrical potential. It is a surface-probing technique that provides information on the surface potential and work function. Ergo…

ORCA™ on Cypher AFMs provides conductive AFM imaging and I-V measurement capabilities. The standard module is capable of measuring currents from ~1 pA to 20 nA. Other current ranges…

The Interferometric Displacement Sensor (IDS) option for Asylum Research Cypher AFMs enables more quantitative Piezoresponse Force Microscopy (PFM) by eliminating the dominant source…

Scanning Capacitance Microscopy (SCM) is a nanoelectrical imaging technique available on Cypher and Jupiter XR atomic force microscopes that uses a microwave radio frequency (RF) signal…

The HV-PFM option on Cypher AFMs enables high sensitivity, high bias, and crosstalk-free measurements on piezoelectrics, including ferroelectrics and multiferroics. The kit includes…

The  Electrochemistry Cell (EC Cell) enables characterization of electrochemical processes (EC-AFM). The EC Cell kit includes a liquid cup, probe holder, sample holder, and standard…

sMIM enables nanoscale permittivity and conductivity mapping on metals, semiconductors, and insulators on Cypher AFMs.

NanoTDDB™ enables characterization of dielectric breakdown with nanoscale precision on Cypher AFMs. Constant or ramped biases up to ±150 V can be applied while monitoring current through…

STM can be useful for ultra-high resolution imaging of conductive samples. Just like AFM imaging, STM benefits from the exceptional stability and low drift of the Cypher systems.

ESM is a novel scanning probe microscopy technique available on Cypher AFMs that is capable of probing electrochemical reactivity and ionic flows in solids with unprecedented resolution.