AFM Systems
Accessories
Probes
Probe Selection Guide
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The MFP-3D Infinity™ is the flagship and highest-performing member of the MFP-3D AFM family. Infinity has the widest range of imaging modes and accessories, with renowned versatility, powerful capabilities, and a system architecture ready for future expansion. The MFP-3D Infinity will make your routine imaging tasks even easier and faster to complete while also supporting your most ambitious projects.
Stunning high performance
Contact mode
DART PFM
Dual AC
Dual AC Resonance Tracking (DART)
Electrostatic Force Microscopy (EFM)
Force curves
Force Mapping Mode (force volume)
Force modulation
Frequency modulation
Kelvin Probe Force Microscopy (KPFM)
Lateral Force Mode (LFM)
Loss tangent imaging
Magnetic Force Microscopy (MFM)
Nanolithography
Nanomanipulation
Phase imaging
Piezoresponse Force Microscopy (PFM)
Switching spectroscopy PFM
Tapping mode (AC mode)
Tapping mode with digital Q control
Vector PFM
AM-FM Viscoelastic Mapping Mode
Contact Resonance Viscoelastic Mapping Mode
Fast Force Mapping Mode
Conductive AFM (CAFM) with ORCA™ and Eclipse™ Mode
Current mapping with Fast Force Mapping
Electrochemical Strain Microscopy (ESM)
High voltage PFM
Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)
Scanning Microwave Impedance Microscopy (sMIM)
Scanning Tunneling Microscopy (STM)
Tools for quantitative characterization of visoelastic properties, including elastic modulus, loss modulus, loss tangent, as well as for measurement of thermal properties
Accessories for subjecting your sample to other driving forces like magnetic fields, mechanical strain, high voltage fields, and more.
Tools for measuring electrical properties, including current, resistivity and permittivity, and more. Also includes PFM, STM, and EC-AFM techniques
Additional options to make the MFP-3D work for you