Part of the Oxford Instruments Group

Jupiter XR AFM

The Jupiter XR Atomic Force Microscope is the first and only large-sample AFM to offer both high-speed imaging and extended range in a single scanner. Jupiter provides complete 200 mm sample access and delivers higher resolution, faster results, a simpler user experience, and the versatility to excel in both academic research and industrial R&D laboratories.

  • Higher resolution than any other large-sample AFM

  • Extended range 100 μm scanner is 5-20× faster than most other AFMs

  • From setup to results, every step is simpler and faster

  • Modular design adapts to your needs for maximum flexibility

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Jupiter XR Brochure

Highest Performance

  • Higher resolution than any other large-sample AFM
  • Extended-range scanner is 5-20× faster than most AFMs and features large 100 μm X-Y & 12 μm Z range
  • Exclusive blueDrive™ Tapping Mode gives more reproducible results and simplifies operation

Simpler User Experience

  • Fully-motorized laser and detector setup eliminates manual adjustment of knobs
  • Fully-addressable, high-speed stage rapidly reaches any point on 200 mm samples
  • Sharp top-view optics help you easily locate your precise region of interest
  • Go from atoms to large 100-μm scans and use any imaging mode, all with the single XR scanner

Versatility for Diverse Research Needs

  • Support for a full range of imaging modes
  • Modular design makes it fast and simple to add accessories and future upgrades
  • Flexible software makes routine measurements easy while enabling advanced research
  • AR Maps - comprehensive analysis software for all types of AFM data

Support that goes above and beyond your expectations

  • Includes a standard one-year comprehensive warranty
  • No-charge technical support and basic applications support for life
  • Affordable support agreements that offer extended warranties and advanced training

Included Operating Modes

Contact mode
Dual AC
Dual AC Resonance Tracking (DART)
Electrostatic Force Microscopy (EFM)
Force curves
Force Mapping Mode (force volume)
Force modulation
Frequency modulation
Kelvin Probe Force Microscopy (KPFM)
Lateral Force Mode (LFM)
Loss tangent imaging
Magnetic Force Microscopy (MFM)
Phase imaging
Piezoresponse Force Microscopy (PFM)
Switching spectroscopy PFM
Tapping mode (AC mode)
Tapping mode with digital Q control
Vector PFM

Included because Jupiter XR comes with blueDrive

AM-FM Viscoelastic Mapping Mode
Contact Resonance Viscoelastic Mapping Mode

Optional Operating Modes

Conductive AFM (CAFM) with ORCA™ and Eclipse™ Mode
Current mapping with Fast Force Mapping
Electrochemical Strain Microscopy (ESM)
Fast Force Mapping Mode
High voltage PFM
Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)

Related Applications

Nanomaterial Growth and CharacterisationMeasurement of Chemical and Molecular CompositionAutomotive TyresBattery TechnologySolar and PV TechnologyMaterial Composition and StructureMechanical and Electrical PropertiesFailure Analysis Measurement of Polymer and Polymer Phase PropertiesImaging of Layered Polymer Structures and Failure AnalysisAnalysing Polymer AdditivesCharacterisation of Low Dimensional StructuresFabrication and Characterisation of Light Emitting Devices

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