Imaging and Manipulating the Stacking States of Twisted Two-Dimensional Materials
October 25 at 6:00pm PT | 9:00pm ET | October 26 at 9:00am China
Vertically stacking two-dimensional (2D) materials to form van der Waals homo- or hetero-structure has become an effective means for regulating their physical and mechanical properties. In particular, when a small twist angle is present at the stacked interface, the 2D structures often show many interesting and even magical physical phenomena owing to the unique interlayer coupling. For such 2D architectures, probing and visualizing their fine atomic stacking structures is essential for understanding their unique physical properties. In this webinar, Dr. Zhang will introduce a new method based on conductive atomic force microscopy (c-AFM) to characterize and reconstruct the internal stacking state of twisted 2D material. Based on this technique, we have observed the nonmonotonic angle-dependent vertical conductivity in twisted bilayer graphene and realized domino-like stacking order switching in twisted monolayer-multilayer graphene.
Asylum Research regularly hosts webinars presented by our customers and our own expert scientists on various topics related to atomic force microscopy (AFM). Please enjoy the recordings below and consider joining our mailing list to receive notifications for future webinar topics.Notify me about future webinars