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Contact Mode Redefined: Unparalleled Resolution with the Vero AFM
The webinar broadcast at the following times:
[Session 1] July 17 at 8am PT | 11am ET | 4pm UK
[Session 2] July 17 at 6pm PT | July 18 at 9am China
The revolutionary new Vero AFM introduces a new era of contact mode imaging, offering unprecedented resolution and precise force control. Contact mode is a fundamental imaging technique in AFM and serves as the foundation for various derivative imaging modes. However, its performance has remained largely unchanged since the inception of AFM. The Vero AFM incorporates a groundbreaking quadrature phase differential interferometry (QPDI) detector design, setting it apart from traditional AFMs that rely on optical beam deflection (OBD) technology. This innovative design significantly reduces the signal detection noise floor, enabling routine contact mode measurements with levels of resolution previously unattainable. In this webinar, contact mode images demonstrating atomic resolution and moiré patterns in twisted bilayer graphene will be shown and discussed.
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Asylum Research regularly hosts webinars presented by our customers and our own expert scientists on various topics related to atomic force microscopy (AFM). Please enjoy the recordings below and consider joining our mailing list to receive notifications for future webinar topics.
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